Electrical and mechanical charaterization of silicon and zinc oxide nanowires

Verfasser / Beitragende:
Samuel Hoffmann
Ort, Verlag, Jahr:
[S.l.] : [s.n.], 2008
Format:
Buch (Hochschulschrift) (online)
Online Zugang:
URN
Record
Thesis
http://www.e-helvetica.nb.admin.ch/directAccess?callnumber=rero-004-103478
ID: 571416128